ion beam analysis

英 [ˈaɪən biːm əˈnæləsɪs] 美 [ˈaɪən biːm əˈnæləsɪs]

n.  离子束分析

化学



双语例句

  1. The Annealing Behavior of Helium Bubble in Metals Studied by Ion Beam Analysis
    离子束分析研究金属中氦泡的退火行为
  2. In this paper, experimental arrangements of measuring hydrogen isotope concentration and distribution in metal hydride with ion beam analysis methods were reported, and the advantage and disadvantage of different methods were analyzed too.
    文章介绍用离子束方法分析贮氢金属中氢同位素含量与分布的实验条件与设计,并分析各自的优、缺点。
  3. Deuterium behaviour in TiD x/ Mo was investigated by ion beam analysis of nuclear reaction analysis ( NRA), elastic recoil detection ( ERD), rutherford backscattering ( RBS).
    用核反应分析(NRA)、前向反冲分析法(ERD)、背散射谱法(RBS)等离子束分析方法研究了TiDx/Mo样品中氘的行为。
  4. The samples of the Ni 80 Fe 20/ Al 2O 3/ Ni 80 Fe 20 magnetic tunnel junction were prepared with the ion beam sputtering and magnetron sputtering technique. The analysis of The relationship between TMR and insulating barrier.
    采用离子束和磁控溅射技术制备了Ni80Fe20/Al2O3/Ni80Fe20磁性隧道结样品,主要研究了中间绝缘层对隧道结磁电阻效应的影响。
  5. Focused Ion Beam is an advanced micro~ nano technology for figure observation, orientation making-sample, component analysis, film deposition and maskless etching.
    20世纪90年代发展起来的聚焦离子束技术是一种集形貌观测、定位制样、成份分析、薄膜淀积和无掩模刻蚀各过程于一身的新型微纳加工技术。
  6. Focus ion beam ( FIB) with liquid metal ion soure ( LMIS) has many applications in modern instrumental analysis and microfabrication.
    液态金属离子源(LMIS)的亚微米聚焦离子束(FIB)在现代分析技术和微细加工等领域有很多应用。介绍一种计算机控制的快速、灵活、准确的束斑测量方法;
  7. Presented in this paper is a summary of the mechanism of mutation breeding induced by ion beam, the achievement of wheat genetic improvement by ion beam implantation, as well as an analysis of the ways to improve the efficiency of mutation breeding by ion beam implantation.
    简述了离子束诱变育种的机理,概述了离子束在小麦遗传改良中所取得的成果,并对提高离子注入小麦的诱变育种效率的方法进行了分析。
  8. The Development of Ion Beam Bioengineering by Literature Analysis in China
    从文献统计看我国离子束生物技术的发展
  9. The simulation calculation for the influence of ion beam non-uniformity in the technological system and the alignment error between substrate and mask center on device properties is carried out. The process improvement scheme is proposed according to the simulation analysis for errors.
    对工艺系统中离子束不均匀度和基片与掩模板中心对准误差对器件性能的影响作了模拟计算,并根据对误差的模拟分析提出了工艺改进方案。
  10. The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe ( SAM) and Secondary Ion Mass Spectroscopy ( SIMS).
    本文通过用扫描俄歇微探针(SAM)和二次离子质谱(SIMS)分析了高能氯离子注入Cu/Si系统,对Cu薄膜附着力增强效应进行了研究。
  11. Ion beam synthesis of C-N crystalline film and its analysis
    C-N多晶的离子束合成及分析
  12. At present, ion beam analysis, such as 8.8 MeV He++ non-Rutherford scattering on high Tc superconductor, is carried out at the third beam line as well.
    目前,在该束线上还进行离子束分析,如用8.8MeVHe~(++)进行高Tc超导体非卢瑟福散射实验等。
  13. Electron and ion beam irradiation effects in AES analysis of sio_2/ si_3n_4/ sio_2/ si multilayer dielectrics
    SiO2/Si3N4/SiO2/Si多层结构绝缘材料在俄歇分析中的电子束和离子束辐照效应
  14. Using a finely focused ion beam, FIB technology can perform product failure analysis at a detail much finer than previously possible.
    使用极细的聚焦离子束,FIB技术可以进行比从前更加精确的产品失效分析。
  15. The influence of variation of components and microstructure caused by dynamic ion beam mixing on chemical properties of the base steel substrate has been investigated by analysis of TEM, AEM and XPS.
    研究其耐蚀性并结合对混合层的TEM、AES和XPS分析,探讨了离子束动态混合引起的组分及微观结构的变化对钢基体化学性能影响的关系。
  16. The applications of ion beam analysis in the investigations of radiation hardening
    离子束分析技术在抗核加固研究中的应用
  17. Introduction of Ion Beam Analysis
    加速器离子束分析简介
  18. With the development of the technology, the ion beam analysis ( IBA) has been widely used in the material science.
    随着科技的进步,离子束分析技术已经广泛应用在材料科学等领域。
  19. Due to the advantage of quantitive, non-destructive and quick and so on, ion beam analysis has been used widely in the determination of elements and their distribution in the materials.
    离子束分析以其无损、快速和定量等优点,被广泛应用于薄膜成分和元素深度分布分析上。